| PART |
Description |
Maker |
| AD5522JSVUZ |
Quad Parametric Measurement Unit With Integrated 16-Bit Level Setting DACs SPECIALTY ANALOG CIRCUIT, PQFP80
|
Analog Devices, Inc.
|
| MAX9952DCCB MAX9952DCCBT MAX9952DCCB-D MAX9952DCCB |
Dual Per-Pin Parametric Measurement Units
|
Maxim Integrated Products
|
| AD5520JSTZ-REEL AD5520JST-REEL |
Per Pin Parametric Measurement Unit/Source Measure Unit
Per Pin Parametric Measurement Unit/Source Measure Unit
|
Analog Devices
|
| TLP202A-14 |
Telecommunications Measurement and Control Equipment Data Acquisition System Measurement Equipment
|
Toshiba Semiconductor
|
| TLP592A |
Telecommunications Measurement and Control Equipment Data Acquisition System Measurement Equipment
|
Toshiba Semiconductor
|
| 4082A |
Parametric Test System
|
Keysight Technologies
|
| N9201A |
Array Structure Parametric Test Option
|
Agilent(Hewlett-Packard)
|
| 4082F |
Flash Memory Cell Parametric Test System
|
Keysight Technologies
|
| ML9XX1104 ML925B11F |
Notice : Some parametric limits are subject to change InGaAsP DFB LASER DIODES
|
Mitsubishi Electric Semiconductor
Mitsubishi Electric Semicon...
|
| AT49BV002AT AT49BV002ANT |
256K x 8 (2M bit), 2.7-Volt Read and 2.7-Volt Write, Top Boot Parametric Block Flash.
|
Atmel
|
| B57861S0103040 B57861S0104040 B57861S0202 B57861S0 |
Temperature Measurement
|
EPCOS
|
| TLP197G07 TLP197G |
Measurement Instrumentation
|
Toshiba Semiconductor
|
